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1. Identity statement
Reference TypeJournal Article
Sitemtc-m16.sid.inpe.br
Holder Codeisadg {BR SPINPE} ibi 8JMKD3MGPCW/3DT298S
Identifier6qtX3pFwXQZGivnJVY/M3iC2
Repositorysid.inpe.br/mtc-m16@80/2006/08.03.13.34   (restricted access)
Last Update2006:11.29.12.06.11 (UTC) administrator
Metadata Repositorysid.inpe.br/mtc-m16@80/2006/08.03.13.35.01
Metadata Last Update2018:06.05.01.16.56 (UTC) administrator
Secondary KeyINPE--PRE/
DOI10.1590/S0103-97332006000300034
ISSN0103-9733
Citation KeyAnjosAbraRapp:2006:GrStCh
TitleGrowth and structural characterization of PbTe/PbEuTe double barrier
ProjectFAPESP (00/12529-6)
Year2006
MonthJune
Access Date2024, May 18
Secondary TypePRE PN
Number of Files1
Size294 KiB
2. Context
Author1 Anjos, Alexandre Miranda Pires dos
2 Abramof, Eduardo
3 Rappl, Paulo Henrique de Oliveira
Resume Identifier1
2 8JMKD3MGP5W/3C9JGUH
3 8JMKD3MGP5W/3C9JJ37
Group1 LAS-INPE-MCT-BR
2 LAS-INPE-MCT-BR
3 LAS-INPE-MCT-BR
Affiliation1 Instituto Nacional de Pesquisas Espaciais, Laboratório Associado de Sensores e Materiais (INPE.LAS)
2 Instituto Nacional de Pesquisas Espaciais, Laboratório Associado de Sensores e Materiais (INPE.LAS)
3 Instituto Nacional de Pesquisas Espaciais, Laboratório Associado de Sensores e Materiais (INPE.LAS)
e-Mail Addressmarcelo.pazos@inpe.br
JournalBrazilian Journal of Physics
Volume36
Number2A
Pages361-364
History (UTC)2006-08-03 13:35:01 :: simone -> administrator ::
2006-09-28 22:33:36 :: administrator -> simone ::
2006-11-29 12:06:11 :: simone -> administrator ::
2012-10-22 20:58:31 :: administrator -> simone :: 2006
2012-11-01 17:30:46 :: simone -> marcelo.pazos@sid.inpe.br :: 2006
2012-11-01 17:32:20 :: marcelo.pazos@sid.inpe.br -> administrator :: 2006
2018-06-05 01:16:56 :: administrator -> :: 2006
3. Content and structure
Is the master or a copy?is the master
Content Stagecompleted
Transferable1
Content TypeExternal Contribution
Version Typepublisher
KeywordsPbTe/PbEuTe double barrier
BaF2 substrates
molecular beam epitaxy
MULTIQUANTUM WELLS
PBTE
AbstractA series of PbTe/PbEuTe double barrier samples with different barrier widths were successfully grown on BaF2 substrates by molecular beam epitaxy. The electron concentration of PbTe spacer and well layers was controlled by the deviation from stoichiometry, while the buffer and cap layers were intentionally doped with bismuth to obtain low-resistivity layers to be used as top and bottom contacts. Assuming 50% of band offset, a barrier height of 150 meV was determined by infrared transmission measurements, corresponding to a PbEuTe barrier with 5% of europium content. The structural parameters of the samples were accurately determined 14 by combining the measurement in a high-resolution x-ray diffractometer in the triple-axis configuration with a simulation within the framework of dynamical theory of diffraction.
AreaFISMAT
Arrangementurlib.net > BDMCI > Fonds > Produção anterior à 2021 > LABAS > Growth and structural...
doc Directory Contentaccess
source Directory Contentthere are no files
agreement Directory Contentthere are no files
4. Conditions of access and use
Languageen
Target FileGrowth and structural characterization.pdf
User Groupadministrator
marcelo.pazos@inpe.br
simone
Reader Groupadministrator
marcelo.pazos@inpe.br
simone
Visibilityshown
Archiving Policydenypublisher denyfinaldraft12
Read Permissiondeny from all and allow from 150.163
Update Permissionnot transferred
5. Allied materials
Next Higher Units8JMKD3MGPCW/3ESR3H2
Citing Item Listsid.inpe.br/bibdigital/2013/09.24.19.30 3
sid.inpe.br/mtc-m21/2012/07.13.14.57.50 2
sid.inpe.br/mtc-m21/2012/07.13.14.44.57 1
URL (untrusted data)http://dx.doi.org/10.1590/S0103-97332006000300034
DisseminationWEBSCI; PORTALCAPES; SCIELO.
Host Collectionsid.inpe.br/banon/2003/08.15.17.40
6. Notes
Empty Fieldsalternatejournal archivist callnumber copyholder copyright creatorhistory descriptionlevel electronicmailaddress format isbn label lineage mark mirrorrepository nextedition notes orcid parameterlist parentrepositories previousedition previouslowerunit progress rightsholder schedulinginformation secondarydate secondarymark session shorttitle sponsor subject tertiarymark tertiarytype typeofwork


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